Xiao Xuan, David Lo, Xin Xia, Yuan Tian
Evaluating defect prediction approaches using a massive set of metrics: an empirical study
SAC, 2015.
@inproceedings{SAC-2015-XuanLXT, author = "Xiao Xuan and David Lo and Xin Xia and Yuan Tian", booktitle = "{Proceedings of the 30th Annual ACM Symposium on Applied Computing}", doi = "10.1145/2695664.2695959", isbn = "978-1-4503-3196-8", pages = "1644--1647", publisher = "{ACM}", title = "{Evaluating defect prediction approaches using a massive set of metrics: an empirical study}", year = 2015, }