Xiao Xuan, David Lo, Xin Xia, Yuan Tian
Evaluating defect prediction approaches using a massive set of metrics: an empirical study
SAC, 2015.
@inproceedings{SAC-2015-XuanLXT,
author = "Xiao Xuan and David Lo and Xin Xia and Yuan Tian",
booktitle = "{Proceedings of the 30th Annual ACM Symposium on Applied Computing}",
doi = "10.1145/2695664.2695959",
isbn = "978-1-4503-3196-8",
pages = "1644--1647",
publisher = "{ACM}",
title = "{Evaluating defect prediction approaches using a massive set of metrics: an empirical study}",
year = 2015,
}











