Evaluating defect prediction approaches using a massive set of metrics: an empirical study
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Xiao Xuan, David Lo, Xin Xia, Yuan Tian
Evaluating defect prediction approaches using a massive set of metrics: an empirical study
SAC, 2015.

SAC 2015
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@inproceedings{SAC-2015-XuanLXT,
	author        = "Xiao Xuan and David Lo and Xin Xia and Yuan Tian",
	booktitle     = "{Proceedings of the 30th Annual ACM Symposium on Applied Computing}",
	doi           = "10.1145/2695664.2695959",
	isbn          = "978-1-4503-3196-8",
	pages         = "1644--1647",
	publisher     = "{ACM}",
	title         = "{Evaluating defect prediction approaches using a massive set of metrics: an empirical study}",
	year          = 2015,
}

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