Victor Sobreira, Marcelo de Almeida Maia
A Visual Trace Analysis Tool for Understanding Feature Scattering
WCRE, 2008.
@inproceedings{WCRE-2008-SobreiraM, author = "Victor Sobreira and Marcelo de Almeida Maia", booktitle = "{Proceedings of the 15th Working Conference on Reverse Engineering}", doi = "10.1109/WCRE.2008.40", editor = "Ahmed E. Hassan and Andy Zaidman and Massimiliano Di Penta", pages = "337--338", publisher = "{IEEE}", title = "{A Visual Trace Analysis Tool for Understanding Feature Scattering}", year = 2008, }