Travelled to:
1 × USA
Collaborated with:
W.Chen S.Kundu
Talks about:
raphson (1) current (1) circuit (1) newton (1) method (1) leakag (1) impact (1) effect (1) scale (1) estim (1)
Person: Ashesh Rastogi
DBLP: Rastogi:Ashesh
Contributed to:
Wrote 1 papers:
- DAC-2007-RastogiCK #on the
- On Estimating Impact of Loading Effect on Leakage Current in Sub-65nm Scaled CMOS Circuits Based on Newton-Raphson Method (AR, WC, SK), pp. 712–715.