Ashesh Rastogi, Wei Chen, Sandip Kundu
On Estimating Impact of Loading Effect on Leakage Current in Sub-65nm Scaled CMOS Circuits Based on Newton-Raphson Method
DAC, 2007.
@inproceedings{DAC-2007-RastogiCK,
author = "Ashesh Rastogi and Wei Chen and Sandip Kundu",
booktitle = "{Proceedings of the 44th Design Automation Conference}",
doi = "10.1145/1278480.1278658",
pages = "712--715",
publisher = "{IEEE}",
title = "{On Estimating Impact of Loading Effect on Leakage Current in Sub-65nm Scaled CMOS Circuits Based on Newton-Raphson Method}",
year = 2007,
}