Travelled to:1 × Canada
1 × France
1 × South Africa
1 × South Korea
Collaborated with:R.S.S.Filho W.K.Chan G.M.Kapfhammer F.Belli M.Linschulte H.A.Stieber A.Heuer S.Konrad K.Lauenroth K.Pohl
Talks about:test (3) likelihood (1) mechatron (1) document (1) approach (1) variabl (1) softwar (1) sequenc (1) practic (1) diagram (1)
Person: Christof J. Budnik
DBLP: Budnik:Christof_J=
Contributed to:
2012
20102010
2010Wrote 4 papers:
- ICST-2012-FilhoB #approach #modelling #testing
- An Integrated Model-Driven Approach for Mechatronic Systems Testing (RSSF, CJB), pp. 447–456.
- ICSE-2010-BudnikCK #automation #testing #theory and practice
- Bridging the Gap Between the Theory and Practice of Software Test Automation (CJB, WKC, GMK), pp. 445–446.
- ICST-2010-BelliLBS #detection #fault #sequence #testing
- Fault Detection Likelihood of Test Sequence Length (FB, ML, CJB, HAS), pp. 402–411.
- SPLC-2010-HeuerBKLP #diagrams #process #semantics #syntax #variability
- Formal Definition of Syntax and Semantics for Documenting Variability in Activity Diagrams (AH, CJB, SK, KL, KP), pp. 62–76.