Travelled to:1 × France
Collaborated with:A.Kunzmann
Talks about:convent (1) design (1) fault (1) delay (1) test (1) scan (1) gate (1)
Person: Frank Böhland
 DBLP: B=ouml=hland:Frank
 DBLP: B=ouml=hland:Frank
Contributed to:
Wrote 1 papers:
- EDAC-1994-KunzmannB #fault
- Gate-Delay Fault Test with Conventional Scan-Design (AK, FB), pp. 524–528.












