Travelled to:
1 × USA
Collaborated with:
K.Cheng S.Dey K.Roy
Talks about:
technolog (1) challeng (1) micron (1) test (1) deep (1) sub (1)
Person: Mike Rodgers
DBLP: Rodgers:Mike
Contributed to:
Wrote 1 papers:
- DAC-2000-ChuengDRR #challenge
- Test challenges for deep sub-micron technologies (KTC, SD, MR, KR), pp. 142–149.