BibSLEIGH — Kwang-Ting

Travelled to:

21 × USA
6 × Germany
7 × France

Collaborated with:

L.Wang M.Marek-Sadowska A.Krstic V.D.Agrawal Y.Jiang K.Chen J.Liou A.S.Krishnakumar G.Parthasarathy M.K.Iyer S.Huang S.Chang M.C.Chao A.Ghofrani W.Lai M.T.Lee F.Lu T.Huang C.Ong H.Tsai S.Bhawmik M.A.Lastras-Montaño D.Hong S.(.Pan Y.Lin K.Yang Y.Chang C.Huang H.Chen H.T.Ma I.Pomeranz ∅ T.M.Mak M.S.Abadir S.Dey D.Chang C.Lin S.Wang S.T.Chakradhar W.Wei A.Rahimi L.Benini R.K.Gupta C.Lo P.Wang H.Chang K.Goh E.Y.Chang J.Huang S.Devadas K.Keutzer P.Agrawal H.Tseng C.Kung S.Saberi C.P.Yue F.Brewer T.Feng C.Lin R.C.Huang S.Kundu M.Rodgers K.Roy J.J.Lu C.Lin D.I.Cheng D.C.Wang T.Lee U.Sparmann D.Luxenburger S.M.Reddy N.S.Woo S.Zhang F.Lin C.Hsu H.Wang M.Abbas Y.Furukawa S.Komatsu K.Asada C.Chiang J.Hou J.Moondanos Z.Hanna L.Chen T.Aikyo Y.Zheng P.Lisherness M.Gao J.Bovington S.Yang K.Fukuda Y.Yeh T.Sekitani T.Someya J.Dworak M.R.Mercer R.Kapur T.W.Williams

Talks about:

test (28) base (13) effici (10) circuit (9) fault (9) delay (9) time (8) generat (7) function (6) diagnosi (6)

Person: Kwang-Ting Cheng

DBLP: Cheng:Kwang=Ting

Contributed to:

2015

2014

2012

2011

2010

2007

2006

2005

2004

2003

2002

2001

2000

1999

1998

1997

1996

1995

1994

1993

1992

1991

1990

1988

Wrote 65 papers:

DATE-2015-Lastras-Montano #configuration management #hybrid #memory management #named: HReRAM: a hybrid reconfigurable resistive random-access memory (MALM, AG, KTC), pp. 1299–1304.
DATE-2015-RahimiGCBG #approximate #energy #memory management: Approximate associative memristive memory for energy-efficient GPUs (AR, AG, KTC, LB, RKG), pp. 1497–1502.
DAC-2014-RahimiGLCBG #architecture #collaboration #compilation #energy: Energy-Efficient GPGPU Architectures via Collaborative Compilation and Memristive Memory-Based Computing (AR, AG, MALM, KTC, LB, RKG), p. 6.
DATE-2014-ZhangLHCW #multi #performance #predict: Joint Virtual Probe: Joint exploration of multiple test items’ spatial patterns for efficient silicon characterization and test prediction (SZ, FL, CKH, KTC, HW), pp. 1–6.
DATE-2012-ZhengLGBYC #communication #configuration management #power management: Power-efficient calibration and reconfiguration for on-chip optical communication (YZ, PL, MG, JB, SY, KTC), pp. 1501–1506.
DATE-2011-WangCC #self: An all-digital built-in self-test technique for transfer function characterization of RF PLLs (PYW, HMC, KTC), pp. 359–364.
DATE-2010-AbbasCFKA #adaptation #automation #framework #generative #performance #testing: An automatic test generation framework for digitally-assisted adaptive equalizers in high-speed serial links (MA, KTC, YF, SK, KA), pp. 1755–1760.
DATE-2010-HuangFLYSSC #design #flexibility #named #novel #pseudo: Pseudo-CMOS: A novel design style for flexible electronics (TCH, KF, CML, YHY, TS, TS, KTC), pp. 154–159.
DATE-2010-LoHCHC #flexibility #multi: A portable multi-pitch e-drum based on printed flexible pressure sensors (CML, TCH, CYC, JH, KTC), pp. 1082–1087.
DAC-2007-HuangTKC #analysis #case study #flexibility #reliability: Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si: H TFT Scan Driver (TCH, HYT, CPK, KTC), pp. 966–969.
DATE-2007-HongSCY #adaptation: A two-tone test method for continuous-time adaptive equalizers (DH, SS, KTC, CPY), pp. 1283–1288.
DATE-2007-PanC #analysis #component #fault #framework #quality #reliability: A framework for system reliability analysis considering both system error tolerance and component test quality (SJ(RP, KTC), pp. 1581–1586.
DAC-2006-ChaoCWCW #analysis #using: Unknown-tolerance analysis and test-quality control for test response compaction using space compactors (MCTC, KTC, SW, STC, WW), pp. 1083–1088.
DATE-2006-ChaoWCWC #using: Coverage loss by using space compactors in presence of unknown values (MCTC, SW, STC, WW, KTC), pp. 1053–1054.
DATE-2006-LinC #multi: Multiple-fault diagnosis based on single-fault activation and single-output observation (YCL, KTC), pp. 424–429.
DATE-2006-YangC #fault: Timing-reasoning-based delay fault diagnosis (KY, KTC), pp. 418–423.
DAC-2005-ParthasarathyICB #learning: Structural search for RTL with predicate learning (GP, MKI, KTC, FB), pp. 451–456.
DATE-2005-IyerPC #constraints #learning #performance #theorem proving: Efficient Conflict-Based Learning in an RTL Circuit Constraint Solver (MKI, GP, KTC), pp. 666–671.
DATE-2005-LuIPWCC #performance #satisfiability: An Efficient Sequential SAT Solver With Improved Search Strategies (FL, MKI, GP, LCW, KTC, KCC), pp. 1102–1107.
DAC-2004-ParthasarathyICW #constraints #performance #theorem proving: An efficient finite-domain constraint solver for circuits (GP, MKI, KTC, LCW), pp. 212–217.
DAC-2004-WangMCA #learning #on the: On path-based learning and its applications in delay test and diagnosis (LCW, TMM, KTC, MSA), pp. 492–497.
DATE-v1-2004-FengWCL #clustering #simulation: Improved Symoblic Simulation by Dynamic Funtional Space Partitioning (TF, LCW, KTC, CCL), pp. 42–49.
DATE-v1-2004-OngHCW #multi #random: Random Jitter Extraction Technique in a Multi-Gigahertz Signal (CKO, DH, KTC, LCW), pp. 286–291.
DATE-v2-2004-MangoCWC #fault #testing: Pattern Selection for Testing of Deep Sub-Micron Timing Defects (MCTC, LCW, KTC), p. 160.
DAC-2003-KrsticWCLM #fault #modelling #statistics: Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models (AK, LCW, KTC, JJL, TMM), pp. 668–673.
DAC-2003-LuWCMH #case study #correlation #industrial: A signal correlation guided ATPG solver and its applications for solving difficult industrial cases (FL, LCW, KTC, JM, ZH), pp. 436–441.
DATE-2003-KrsticWCLA #fault #modelling #statistics: Delay Defect Diagnosis Based Upon Statistical Timing Models — The First Step (AK, LCW, KTC, JJL, MSA), pp. 10328–10335.
DATE-2003-LuWCH #correlation #learning #satisfiability: A Circuit SAT Solver With Signal Correlation Guided Learning (FL, LCW, KTC, RCYH), pp. 10892–10897.
DAC-2002-ChangC #implementation #self #verification: Self-referential verification of gate-level implementations of arithmetic circuits (YTC, KTC), pp. 311–316.
DAC-2002-KrsticLCCD #design #embedded #self: Embedded software-based self-testing for SoC design (AK, WCL, KTC, LC, SD), pp. 355–360.
DAC-2002-LiouKWC #analysis #performance #statistics #testing #validation: False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation (JJL, AK, LCW, KTC), pp. 566–569.
DAC-2002-LiouWCDMKW #fault #multi #performance #testing #using: Enhancing test efficiency for delay fault testing using multiple-clocked schemes (JJL, LCW, KTC, JD, MRM, RK, TWW), pp. 371–374.
CIKM-2001-GohCC #classification #image: SVM Binary Classifier Ensembles for Image Classification (KG, EYC, KTC), pp. 395–402.
DAC-2001-LaiC #testing: Instruction-Level DFT for Testing Processor and IP Cores in System-on-a-Chip (WCL, KTC), pp. 59–64.
DAC-2001-LiouCKK #analysis #performance #probability #statistics: Fast Statistical Timing Analysis By Probabilistic Event Propagation (JJL, KTC, SK, AK), pp. 661–666.
DAC-2000-ChuengDRR #challenge: Test challenges for deep sub-micron technologies (KTC, SD, MR, KR), pp. 142–149.
DAC-2000-HuangC #composition #constraints: Assertion checking by combined word-level ATPG and modular arithmetic constraint-solving techniques (CYH, KTC), pp. 118–123.
DATE-2000-HuangOC #testing: A BIST Scheme for On-Chip ADC and DAC Testing (JLH, CKO, KTC), pp. 216–220.
DAC-1999-JiangC #analysis #performance #power management: Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices (YMJ, KTC), pp. 760–765.
DAC-1999-TsaiCB #quality #using: Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme (HCT, KTC, SB), pp. 748–753.
DAC-1998-HuangCCL #design #fault: Fault-Simulation Based Design Error Diagnosis for Sequential Circuits (SYH, KTC, KCC, JYJL), pp. 632–637.
DATE-1998-ChangCML #functional #testing: Functional Scan Chain Testing (DC, KTC, MMS, MTCL), pp. 278–283.
DATE-1998-JiangC #approximate #estimation: Exact and Approximate Estimation for Maximum Instantaneous Current of CMOS Circuits (YMJ, KTC), pp. 698–702.
DAC-1997-ChangLMAC #approach #synthesis: A Test Synthesis Approach to Reducing BALLAST DFT Overhead (DC, MTCL, MMS, TA, KTC), pp. 466–471.
DAC-1997-JiangKCM #logic #optimisation #performance: Post-Layout Logic Restructuring for Performance Optimization (YMJ, AK, KTC, MMS), pp. 662–665.
DAC-1997-KrsticC #generative: Vector Generation for Maximum Instantaneous Current Through Supply Lines for CMOS Circuits (AK, KTC), pp. 383–388.
DAC-1997-TsaiCLB #algorithm #hybrid: A Hybrid Algorithm for Test Point Selection for Scan-Based BIST (HCT, KTC, CJL, SB), pp. 478–483.
DAC-1996-ChengCWM #estimation #hybrid: A New Hybrid Methodology for Power Estimation (DIC, KTC, DCW, MMS), pp. 439–444.
DAC-1996-HuangCC #fault #verification: Error Correction Based on Verification Techniques (SYH, KCC, KTC), pp. 258–261.
DAC-1996-HuangCCL #generative #simulation: Compact Vector Generation for Accurate Power Simulation (SYH, KCC, KTC, TCL), pp. 161–164.
DAC-1996-LinMCL #logic: Test Point Insertion: Scan Paths through Combinational Logic (CCL, MMS, KTC, MTCL), pp. 268–273.
DAC-1995-ChangMC #algorithm #performance #set: An Efficient Algorithm for Local Don’t Care Sets Calculation (SCC, MMS, KTC), pp. 663–667.
DAC-1995-LinCCMC #logic #synthesis: Logic Synthesis for Engineering Change (CCL, KCC, SCC, MMS, KTC), pp. 647–652.
DAC-1995-SparmannLCR #fault #identification #performance #robust: Fast Identification of Robust Dependent Path Delay Faults (US, DL, KTC, SMR), pp. 119–125.
DAC-1994-ChangCWM #layout #logic #synthesis: Layout Driven Logic Synthesis for FPGAs (SCC, KTC, NSW, MMS), pp. 308–313.
DAC-1994-ChengC #fault #generative #quality #testing: Generation of High Quality Non-Robust Tests for Path Delay Faults (KTC, HCC), pp. 365–369.
DAC-1994-KrishnakumarC #hybrid #modelling #on the #set: On the Computation of the Set of Reachable States of Hybrid Models (ASK, KTC), pp. 615–621.
DAC-1993-ChengK #automation #finite #functional #generative #state machine #testing #using: Automatic Functional Test Generation Using the Extended Finite State Machine Model (KTC, ASK), pp. 86–91.
DAC-1992-ChengM #algorithm #on the #problem: On the Over-Specification Problem in Sequential ATPG Algorithms (KTC, HKTM), pp. 16–21.
DAC-1992-PomeranzC #using: State Assignment Using Input/Output Functions (IP, KTC), pp. 573–577.
DAC-1991-Cheng #on the: On Removing Redundancy in Sequential Circuits (KTC), pp. 164–169.
DAC-1991-ChengDK #design #generative #robust #standard #synthesis #testing: Robust Delay-Fault Test Generation and Synthesis for Testability Under A Standard Scan Design Methodology (KTC, SD, KK), pp. 80–86.
DAC-1990-AgrawalC #specification #synthesis: Test Function Specification in Synthesis (VDA, KTC), pp. 235–240.
DAC-1990-ChengA #complexity #multi: An Entropy Measure for the Complexity of Multi-Output Boolean Functions (KTC, VDA), pp. 302–305.
DAC-1988-AgrawalCA #concurrent #contest #generative #named: Contest: A Concurrent Test Generator for Sequential Circuits (VDA, KTC, PA), pp. 84–89.