Travelled to:1 × USA
Collaborated with:P.Royannez H.Mair F.Dahan M.Streeter L.Bouetel J.Blasquez H.Clasen G.Semino J.Dong D.Scott B.Pitts C.Raibaut U.Ko
Talks about:techniqu (1) platform (1) reduct (1) leakag (1) design (1)
Person: Mike Wagner
DBLP: Wagner:Mike
Contributed to:
2005Wrote 1 papers:
- DAC-2005-RoyannezMDWSBBCSDSPRK #design #framework #platform #reduction
- A design platform for 90-nm leakage reduction techniques (PR, HM, FD, MW, MS, LB, JB, HC, GS, JD, DS, BP, CR, UK), pp. 549–550.