Travelled to:1 × France
1 × USA
Collaborated with:M.v.Hulst A.Fedeli J.Lambert D.Borrione C.Hanoch P.Bricaud P.Royannez H.Mair F.Dahan M.Wagner M.Streeter L.Bouetel H.Clasen G.Semino J.Dong D.Scott B.Pitts C.Raibaut U.Ko
Talks about:techniqu (2) platform (1) perspect (1) industri (1) status (1) reduct (1) leakag (1) formal (1) design (1) verif (1)
Person: Joel Blasquez
DBLP: Blasquez:Joel
Contributed to:
2005
2002Wrote 2 papers:
- DAC-2005-RoyannezMDWSBBCSDSPRK #design #framework #platform #reduction
- A design platform for 90-nm leakage reduction techniques (PR, HM, FD, MW, MS, LB, JB, HC, GS, JD, DS, BP, CR, UK), pp. 549–550.
- DATE-2002-BlasquezHFLBHB #industrial #verification
- Formal Verification Techniques: Industrial Status and Perspectives (JB, MvH, AF, JLL, DB, CH, PB), p. 1050.