Travelled to:
1 × USA
Collaborated with:
∅
Talks about:
incorpor (1) testabl (1) circuit (1) automat (1) chip (1)
Person: Noriyuki Ito
DBLP: Ito:Noriyuki
Contributed to:
Wrote 1 papers:
- DAC-1990-Ito #automation #testing
- Automatic Incorporation of On-Chip Testability Circuits (NI), pp. 529–534.