Travelled to:1 × USA
Collaborated with:J.W.Cangussu
Talks about:defect (2) bayesian (1) model (1) estim (1) decay (1) base (1) bay (1)
Person: Syed Waseem Haider
DBLP: Haider:Syed_Waseem
Contributed to:
2006Wrote 1 papers:
- SEKE-2006-HaiderC #estimation #fault
- Bayesian Estimation of Defects based on Defect Decay Model: BayesED3M (SWH, JWC), pp. 256–261.