Travelled to:3 × USA
Collaborated with:N.Wakatsuki A.Yamada T.Arima T.Fukui H.Shibano O.Itoh K.Tomita
Talks about:generat (3) system (3) test (3) automat (2) digit (2) larg (2) circuit (1) locat (1) level (1) japan (1)
Person: Shigehiro Funatsu
DBLP: Funatsu:Shigehiro
Contributed to:
197819771975Wrote 3 papers:
- DAC-1978-YamadaWFF #automation #fault #generative #scalability #testing
- Automatic System Level Test Generation and Fault Location for Large Digital Systems (AY, NW, TF, SF), pp. 347–352.
- DAC-1977-YamadaWSITF #automation #generative #scalability #testing
- Automatic test generation for large digital circuits (AY, NW, HS, OI, KT, SF), pp. 78–83.
- DAC-1975-FunatsuWA #generative #testing
- Test generation systems in Japan (SF, NW, TA), pp. 114–122.