Travelled to:1 × Republic of China
1 × USA
Collaborated with:Y.Li P.Hsiung
Talks about:lithographi (1) gridless (1) conflict (1) pattern (1) system (1) safeti (1) detail (1) critic (1) verif (1) model (1)
Person: Yen-Hung Lin
DBLP: Lin:Yen=Hung
Contributed to:
2010
2005Wrote 2 papers:
- DAC-2010-LinL #graph
- Double patterning lithography aware gridless detailed routing with innovative conflict graph (YHL, YLL), pp. 398–403.
- SEKE-2005-HsiungL #modelling #safety #verification
- Model-based Verification of Safety-Critical Systems (PAH, YHL), pp. 596–601.