Travelled to:1 × Germany
3 × USA
Collaborated with:∅ L.Xie A.Davoodi C.Liu S.J.Upadhyaya P.Subramanyan V.Singh E.Larsson X.Wen K.Miyase T.Suzuki S.Kajihara Y.Ohsumi
Talks about:test (3) fault (2) multiprocessor (1) manufactur (1) speedpath (1) multiplex (1) techniqu (1) programm (1) diagnosi (1) silicon (1)
Person: Kewal K. Saluja
DBLP: Saluja:Kewal_K=
Contributed to:
2010
2010200719871982Wrote 5 papers:
- DAC-2010-XieDS
- Post-silicon diagnosis of segments of failing speedpaths due to manufacturing variations (LX, AD, KKS), pp. 274–279.
- DATE-2010-SubramanyanSSL #execution #fault tolerance #multi #performance
- Multiplexed redundant execution: A technique for efficient fault tolerance in chip multiprocessors (PS, VS, KKS, EL), pp. 1572–1577.
- DAC-2007-WenMSKOS #effectiveness #reduction #testing
- Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing (XW, KM, TS, SK, YO, KKS), pp. 527–532.
- DAC-1987-LiuSU #array #design #logic #named #programmable #scalability #self
- BIST-PLA: A Built-in Self-Test Design of Large Programmable Logic Arrays (CYL, KKS, SJU), pp. 385–391.
- DAC-1982-Saluja #fault #generative
- An enhancement of lssd to reduce test pattern generation effort and increase fault coverage (KKS), pp. 489–494.