@inproceedings{DAC-1985-OgiharaSM,
	author        = "Takuji Ogihara and Shuichi Saruyama and Shinichi Murai",
	booktitle     = "{Proceedings of the 22nd Design Automation Conference}",
	doi           = "10.1145/317825.317859",
	isbn          = "0-8186-0635-5",
	pages         = "212--218",
	publisher     = "{ACM}",
	title         = "{PATEGE: an automatic DC parametric test generation system for series gated ECL circuits}",
	year          = 1985,
}