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Travelled to:
1 × USA
Collaborated with:
T.Ogihara S.Murai
Talks about:
parametr (1) generat (1) circuit (1) automat (1) system (1) pateg (1) test (1) seri (1) gate (1) ecl (1)

Person: Shuichi Saruyama

DBLP DBLP: Saruyama:Shuichi

Contributed to:

DAC 19851985

Wrote 1 papers:

DAC-1985-OgiharaSM #automation #generative #named #parametricity #testing
PATEGE: an automatic DC parametric test generation system for series gated ECL circuits (TO, SS, SM), pp. 212–218.
Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.