Takuji Ogihara, K. Muroi, Genichi Yonemori, Shinichi Murai
MULTES/IS: An Effective and Reliable Test Generation System for Partial Scan and Non-Scan Synchronous Circuits
DAC, 1989.
@inproceedings{DAC-1989-OgiharaMYM,
author = "Takuji Ogihara and K. Muroi and Genichi Yonemori and Shinichi Murai",
booktitle = "{Proceedings of the 26th Design Automation Conference}",
doi = "10.1145/74382.74469",
pages = "519--524",
publisher = "{ACM Press}",
title = "{MULTES/IS: An Effective and Reliable Test Generation System for Partial Scan and Non-Scan Synchronous Circuits}",
year = 1989,
}