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Travelled to:
1 × USA
Collaborated with:
T.Ogihara G.Yonemori S.Murai
Talks about:
scan (2) synchron (1) reliabl (1) partial (1) generat (1) circuit (1) system (1) effect (1) test (1) mult (1)

Person: K. Muroi

DBLP DBLP: Muroi:K=

Contributed to:

DAC 19891989

Wrote 1 papers:

DAC-1989-OgiharaMYM #effectiveness #generative #named #reliability #testing
MULTES/IS: An Effective and Reliable Test Generation System for Partial Scan and Non-Scan Synchronous Circuits (TO, KM, GY, SM), pp. 519–524.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.