Scott D. Huss, Ronald S. Gyurcsik
Optimal Ordering of Analog Integrated Circuit Tests to Minimize Test Time
DAC, 1991.
@inproceedings{DAC-1991-HussG,
author = "Scott D. Huss and Ronald S. Gyurcsik",
booktitle = "{Proceedings of the 28th Design Automation Conference}",
doi = "10.1145/127601.127718",
isbn = "0-89791395-7",
pages = "494--499",
publisher = "{ACM}",
title = "{Optimal Ordering of Analog Integrated Circuit Tests to Minimize Test Time}",
year = 1991,
}