Travelled to:1 × USA
Collaborated with:R.S.Gyurcsik
Talks about:test (2) circuit (1) integr (1) analog (1) order (1) optim (1) minim (1) time (1)
Person: Scott D. Huss
DBLP: Huss:Scott_D=
Contributed to:
1991Wrote 1 papers:
- DAC-1991-HussG #testing
- Optimal Ordering of Analog Integrated Circuit Tests to Minimize Test Time (SDH, RSG), pp. 494–499.