Travelled to:1 × USA
Collaborated with:G.Gad-El-Karim S.D.Huss
Talks about:analog (2) test (2) perform (1) generat (1) circuit (1) sensit (1) layout (1) integr (1) order (1) optim (1)
Person: Ronald S. Gyurcsik
DBLP: Gyurcsik:Ronald_S=
Contributed to:
1991Wrote 2 papers:
- DAC-1991-Gad-El-KarimG #generative #layout #performance
- Generation of Performance Sensitivities for Analog Cell Layout (GGEK, RSG), pp. 500–505.
- DAC-1991-HussG #testing
- Optimal Ordering of Analog Integrated Circuit Tests to Minimize Test Time (SDH, RSG), pp. 494–499.