Amitava Majumdar, Sarma Sastry
On the Distribution of Fault Coverage and Test length in Random Testing of Combinational Circuits
DAC, 1992.
@inproceedings{DAC-1992-MajumdarS,
acmid = "113938.149485",
author = "Amitava Majumdar and Sarma Sastry",
booktitle = "{Proceedings of the 29th Design Automation Conference}",
isbn = "0-8186-2822-7",
pages = "341--346",
publisher = "{IEEE Computer Society Press}",
title = "{On the Distribution of Fault Coverage and Test length in Random Testing of Combinational Circuits}",
year = 1992,
}