Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits
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Seiji Kajihara, Irith Pomeranz, Kozo Kinoshita, Sudhakar M. Reddy
Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits
DAC, 1993.

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@inproceedings{DAC-1993-KajiharaPKR,
	author        = "Seiji Kajihara and Irith Pomeranz and Kozo Kinoshita and Sudhakar M. Reddy",
	booktitle     = "{Proceedings of the 30th Design Automation Conference}",
	doi           = "10.1145/157485.164617",
	isbn          = "0-89791-577-1",
	pages         = "102--106",
	publisher     = "{ACM Press}",
	title         = "{Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits}",
	year          = 1993,
}

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