Anshuman Chandra, Krishnendu Chakrabarty
Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip
DAC, 2001.
@inproceedings{DAC-2001-ChandraC,
author = "Anshuman Chandra and Krishnendu Chakrabarty",
booktitle = "{Proceedings of the 38th Design Automation Conference}",
doi = "10.1145/378239.378396",
isbn = "1-58113-297-2",
pages = "166--169",
publisher = "{ACM}",
title = "{Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip}",
year = 2001,
}