Michael L. Behm, John M. Ludden, Yossi Lichtenstein, Michal Rimon, Michael Vinov
Industrial experience with test generation languages for processor verification
DAC, 2004.
@inproceedings{DAC-2004-BehmLLRV,
author = "Michael L. Behm and John M. Ludden and Yossi Lichtenstein and Michal Rimon and Michael Vinov",
booktitle = "{Proceedings of the 41st Design Automation Conference}",
doi = "10.1145/996566.996578",
isbn = "1-58113-828-8",
pages = "36--40",
publisher = "{ACM}",
title = "{Industrial experience with test generation languages for processor verification}",
year = 2004,
}











