Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing
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Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja
Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing
DAC, 2007.

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@inproceedings{DAC-2007-WenMSKOS,
	author        = "Xiaoqing Wen and Kohei Miyase and Tatsuya Suzuki and Seiji Kajihara and Yuji Ohsumi and Kewal K. Saluja",
	booktitle     = "{Proceedings of the 44th Design Automation Conference}",
	doi           = "10.1145/1278480.1278615",
	pages         = "527--532",
	publisher     = "{IEEE}",
	title         = "{Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing}",
	year          = 2007,
}

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