Travelled to:1 × USA
Collaborated with:X.Wen K.Miyase T.Suzuki S.Kajihara K.K.Saluja
Talks about:reduct (1) effect (1) critic (1) speed (1) test (1) scan (1) path (1) fill (1) drop (1) awar (1)
Person: Yuji Ohsumi
DBLP: Ohsumi:Yuji
Contributed to:
2007Wrote 1 papers:
- DAC-2007-WenMSKOS #effectiveness #reduction #testing
- Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing (XW, KM, TS, SK, YO, KKS), pp. 527–532.