Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
DAC, 2008.
@inproceedings{DAC-2008-YeLNC,
author = "Yun Ye and Frank Liu and Sani R. Nassif and Yu Cao",
booktitle = "{Proceedings of the 45th Design Automation Conference}",
doi = "10.1145/1391469.1391698",
isbn = "978-1-60558-115-6",
pages = "900--905",
publisher = "{ACM}",
title = "{Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness}",
year = 2008,
}











