Travelled to:1 × China
2 × USA
Collaborated with:J.Li F.Liu Y.Cao M.Chen S.R.Nassif
Talks about:under (2) threshold (1) fluctuat (1) variabl (1) transit (1) thermal (1) statist (1) process (1) practic (1) pattern (1)
Person: Yun Ye
DBLP: Ye:Yun
Contributed to:
2011
20092008Wrote 3 papers:
- ICEIS-v2-2011-YeL #theory and practice
- Analyzing Data from AVL/APC System for Improving Transit Management — Theory and Practice (YY, JL), pp. 267–274.
- DAC-2009-YeLCC #analysis #layout #process #variability
- Variability analysis under layout pattern-dependent rapid-thermal annealing process (YY, FL, MC, YC), pp. 551–556.
- DAC-2008-YeLNC #modelling #simulation #statistics
- Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness (YY, FL, SRN, YC), pp. 900–905.