Kun Yuan, Katrina Lu, David Z. Pan
Double patterning lithography friendly detailed routing with redundant via consideration
DAC, 2009.
@inproceedings{DAC-2009-YuanLP,
author = "Kun Yuan and Katrina Lu and David Z. Pan",
booktitle = "{Proceedings of the 46th Design Automation Conference}",
doi = "10.1145/1629911.1629930",
isbn = "978-1-60558-497-3",
pages = "63--66",
publisher = "{ACM}",
title = "{Double patterning lithography friendly detailed routing with redundant via consideration}",
year = 2009,
}











