Kun Yuan, Katrina Lu, David Z. Pan
Double patterning lithography friendly detailed routing with redundant via consideration
DAC, 2009.
@inproceedings{DAC-2009-YuanLP, author = "Kun Yuan and Katrina Lu and David Z. Pan", booktitle = "{Proceedings of the 46th Design Automation Conference}", doi = "10.1145/1629911.1629930", isbn = "978-1-60558-497-3", pages = "63--66", publisher = "{ACM}", title = "{Double patterning lithography friendly detailed routing with redundant via consideration}", year = 2009, }