Travelled to:
1 × USA
Collaborated with:
K.Yuan D.Z.Pan
Talks about:
lithographi (1) consider (1) pattern (1) redund (1) friend (1) detail (1) doubl (1) rout (1)
Person: Katrina Lu
DBLP: Lu:Katrina
Contributed to:
Wrote 1 papers:
- DAC-2009-YuanLP
- Double patterning lithography friendly detailed routing with redundant via consideration (KY, KL, DZP), pp. 63–66.