Post-silicon diagnosis of segments of failing speedpaths due to manufacturing variations
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Lin Xie, Azadeh Davoodi, Kewal K. Saluja
Post-silicon diagnosis of segments of failing speedpaths due to manufacturing variations
DAC, 2010.

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@inproceedings{DAC-2010-XieDS,
	author        = "Lin Xie and Azadeh Davoodi and Kewal K. Saluja",
	booktitle     = "{Proceedings of the 47th Design Automation Conference}",
	doi           = "10.1145/1837274.1837344",
	isbn          = "978-1-4503-0002-5",
	pages         = "274--279",
	publisher     = "{ACM}",
	title         = "{Post-silicon diagnosis of segments of failing speedpaths due to manufacturing variations}",
	year          = 2010,
}


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