Embedding statistical tests for on-chip dynamic voltage and temperature monitoring
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Lionel Vincent, Philippe Maurine, Suzanne Lesecq, Edith Beigné
Embedding statistical tests for on-chip dynamic voltage and temperature monitoring
DAC, 2012.

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@inproceedings{DAC-2012-LionelPSE,
	author        = "Lionel Vincent and Philippe Maurine and Suzanne Lesecq and Edith Beigné",
	booktitle     = "{Proceedings of the 49th Annual Design Automation Conference}",
	doi           = "10.1145/2228360.2228539",
	isbn          = "978-1-4503-1199-1",
	pages         = "994--999",
	publisher     = "{ACM}",
	title         = "{Embedding statistical tests for on-chip dynamic voltage and temperature monitoring}",
	year          = 2012,
}

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