Travelled to:2 × USA
Collaborated with:E.Beigné L.Vincent P.Maurine Y.Akgul D.Puschini I.M.Panades P.Benoit L.Torres
Talks about:dynam (2) temperatur (1) statist (1) monitor (1) circuit (1) voltag (1) power (1) manag (1) embed (1) test (1)
Person: Suzanne Lesecq
DBLP: Lesecq:Suzanne
Contributed to:
20142012Wrote 2 papers:
- DAC-2014-AkgulPLBPBT #power management
- Power management through DVFS and dynamic body biasing in FD-SOI circuits (YA, DP, SL, EB, IMP, PB, LT), p. 6.
- DAC-2012-LionelPSE #monitoring #statistics #testing
- Embedding statistical tests for on-chip dynamic voltage and temperature monitoring (LV, PM, SL, EB), pp. 994–999.