Bei Yu, Kun Yuan, Jhih-Rong Gao, David Z. Pan
E-BLOW: e-beam lithography overlapping aware stencil planning for MCC system
DAC, 2013.
@inproceedings{DAC-2013-YuYGP,
author = "Bei Yu and Kun Yuan and Jhih-Rong Gao and David Z. Pan",
booktitle = "{Proceedings of the 50th Annual Design Automation Conference}",
doi = "10.1145/2463209.2488819",
isbn = "978-1-4503-2071-9",
pages = "7",
publisher = "{ACM}",
title = "{E-BLOW: e-beam lithography overlapping aware stencil planning for MCC system}",
year = 2013,
}











