BibSLEIGH — Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks

Dimitris Nikolos, Haridimos T. Vergos, Th. Haniotakis, Y. Tsiatouhas
Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks
DATE, 1999.

DATE 1999

@inproceedings{DATE-1999-NikolosVHT,
	author        = "Dimitris Nikolos and Haridimos T. Vergos and Th. Haniotakis and Y. Tsiatouhas",
	booktitle     = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.1999.761105",
	isbn          = "0-7695-0078-1",
	pages         = "112--116",
	publisher     = "{IEEE Computer Society}",
	title         = "{Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks}",
	year          = 1999,
}

Dimitris Nikolos, Haridimos T. Vergos, Th. Haniotakis, Y. TsiatouhasPath Delay Fault Testing of ICs with Embedded Intellectual Property BlocksDATE, 1999.

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Dimitris Nikolos, Haridimos T. Vergos, Th. Haniotakis, Y. Tsiatouhas
Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks
DATE, 1999.