Travelled to:1 × Germany
Collaborated with:D.Nikolos T.Haniotakis Y.Tsiatouhas
Talks about:intellectu (1) properti (1) fault (1) embed (1) delay (1) block (1) test (1) path (1)
Person: Haridimos T. Vergos
DBLP: Vergos:Haridimos_T=
Contributed to:
1999Wrote 1 papers:
- DATE-1999-NikolosVHT #embedded #fault #testing
- Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks (DN, HTV, TH, YT), pp. 112–116.