Lun Ye, Foong-Charn Chang, Peter Feldmann, Rakesh Chadha, Nagaraj Ns, Frank Cano
Chip-Level Verification for Parasitic Coupling Effects in Deep-Submicron Digital Designs
DATE, 1999.
@inproceedings{DATE-1999-YeCFCNC,
author = "Lun Ye and Foong-Charn Chang and Peter Feldmann and Rakesh Chadha and Nagaraj Ns and Frank Cano",
booktitle = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.1999.761199",
isbn = "0-7695-0078-1",
pages = "658--663",
publisher = "{IEEE Computer Society}",
title = "{Chip-Level Verification for Parasitic Coupling Effects in Deep-Submicron Digital Designs}",
year = 1999,
}