Travelled to:
1 × Germany
Collaborated with:
F.Chang P.Feldmann R.Chadha N.Ns F.Cano
Talks about:
submicron (1) parasit (1) effect (1) design (1) verif (1) level (1) digit (1) coupl (1) deep (1) chip (1)
Person: Lun Ye
DBLP: Ye:Lun
Contributed to:
Wrote 1 papers:
- DATE-1999-YeCFCNC #design #verification
- Chip-Level Verification for Parasitic Coupling Effects in Deep-Submicron Digital Designs (LY, FCC, PF, RC, NN, FC), pp. 658–663.