Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-a-Chip Test Data Compression/Decompression
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Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici
Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-a-Chip Test Data Compression/Decompression
DATE, 2002.

DATE 2002
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@inproceedings{DATE-2002-GonciariAN,
	acmid         = "874385",
	author        = "Paul Theo Gonciari and Bashir M. Al-Hashimi and Nicola Nicolici",
	booktitle     = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2002.998363",
	isbn          = "0-7695-1471-5",
	pages         = "604--611",
	publisher     = "{IEEE Computer Society}",
	title         = "{Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-a-Chip Test Data Compression/Decompression}",
	year          = 2002,
}

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