Michael Pronath, Helmut E. Graeb, Kurt Antreich
A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits
DATE, 2002.
@inproceedings{DATE-2002-PronathGA, acmid = "874365", author = "Michael Pronath and Helmut E. Graeb and Kurt Antreich", booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2002.998252", isbn = "0-7695-1471-5", pages = "78--83", publisher = "{IEEE Computer Society}", title = "{A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits}", year = 2002, }