A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits
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Michael Pronath, Helmut E. Graeb, Kurt Antreich
A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits
DATE, 2002.

DATE 2002
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@inproceedings{DATE-2002-PronathGA,
	acmid         = "874365",
	author        = "Michael Pronath and Helmut E. Graeb and Kurt Antreich",
	booktitle     = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2002.998252",
	isbn          = "0-7695-1471-5",
	pages         = "78--83",
	publisher     = "{IEEE Computer Society}",
	title         = "{A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits}",
	year          = 2002,
}

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