Test Structure for IC(VBE) Parameter Determination of Low Voltage Applications
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Wenceslas Rahajandraibe, Christian Dufaza, Daniel Auvergne, B. Cialdella, B. Majoux, V. Chowdhury
Test Structure for IC(VBE) Parameter Determination of Low Voltage Applications
DATE, 2002.

DATE 2002
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@inproceedings{DATE-2002-RahajandraibeDACMC,
	acmid         = "874348",
	author        = "Wenceslas Rahajandraibe and Christian Dufaza and Daniel Auvergne and B. Cialdella and B. Majoux and V. Chowdhury",
	booktitle     = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2002.998291",
	isbn          = "0-7695-1471-5",
	pages         = "316--321",
	publisher     = "{IEEE Computer Society}",
	title         = "{Test Structure for IC(VBE) Parameter Determination of Low Voltage Applications}",
	year          = 2002,
}

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