Wenceslas Rahajandraibe, Christian Dufaza, Daniel Auvergne, B. Cialdella, B. Majoux, V. Chowdhury
Test Structure for IC(VBE) Parameter Determination of Low Voltage Applications
DATE, 2002.
@inproceedings{DATE-2002-RahajandraibeDACMC,
acmid = "874348",
author = "Wenceslas Rahajandraibe and Christian Dufaza and Daniel Auvergne and B. Cialdella and B. Majoux and V. Chowdhury",
booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2002.998291",
isbn = "0-7695-1471-5",
pages = "316--321",
publisher = "{IEEE Computer Society}",
title = "{Test Structure for IC(VBE) Parameter Determination of Low Voltage Applications}",
year = 2002,
}
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