Hui Zheng, Lawrence T. Pileggi, Michael W. Beattie, Byron Krauter
Window-Based Susceptance Models for Large-Scale RLC Circuit Analyses
DATE, 2002.
@inproceedings{DATE-2002-ZhengPBK,
acmid = "874378",
author = "Hui Zheng and Lawrence T. Pileggi and Michael W. Beattie and Byron Krauter",
booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2002.998366",
isbn = "0-7695-1471-5",
pages = "628--633",
publisher = "{IEEE Computer Society}",
title = "{Window-Based Susceptance Models for Large-Scale RLC Circuit Analyses}",
year = 2002,
}