Layout-Driven SOC Test Architecture Design for Test Time and Wire Length Minimization
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Sandeep Kumar Goel, Erik Jan Marinissen
Layout-Driven SOC Test Architecture Design for Test Time and Wire Length Minimization
DATE, 2003.

DATE 2003
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@inproceedings{DATE-2003-GoelM,
	acmid         = "1022813",
	author        = "Sandeep Kumar Goel and Erik Jan Marinissen",
	booktitle     = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2003.10171",
	isbn          = "0-7695-1870-2",
	pages         = "10738--10741",
	publisher     = "{IEEE Computer Society}",
	title         = "{Layout-Driven SOC Test Architecture Design for Test Time and Wire Length Minimization}",
	year          = 2003,
}

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Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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