Sandeep Kumar Goel, Erik Jan Marinissen
Layout-Driven SOC Test Architecture Design for Test Time and Wire Length Minimization
DATE, 2003.
@inproceedings{DATE-2003-GoelM,
acmid = "1022813",
author = "Sandeep Kumar Goel and Erik Jan Marinissen",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2003.10171",
isbn = "0-7695-1870-2",
pages = "10738--10741",
publisher = "{IEEE Computer Society}",
title = "{Layout-Driven SOC Test Architecture Design for Test Time and Wire Length Minimization}",
year = 2003,
}