BibSLEIGH — A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis

Chunsheng Liu, Krishnendu Chakrabarty
A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis
DATE, 2003.

DATE 2003

@inproceedings{DATE-2003-LiuC,
	acmid         = "1022731",
	author        = "Chunsheng Liu and Krishnendu Chakrabarty",
	booktitle     = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2003.10074",
	isbn          = "0-7695-1870-2",
	pages         = "10230--10237",
	publisher     = "{IEEE Computer Society}",
	title         = "{A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis}",
	year          = 2003,
}

Chunsheng Liu, Krishnendu ChakrabartyA Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault DiagnosisDATE, 2003.

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Chunsheng Liu, Krishnendu Chakrabarty
A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis
DATE, 2003.