BibSLEIGH — A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application

Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Raychowdhury, Kaushik Roy
A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application
DATE, 2005.

DATE 2005

@inproceedings{DATE-2005-BhuniaMRR,
	author        = "Swarup Bhunia and Hamid Mahmoodi-Meimand and Arijit Raychowdhury and Kaushik Roy",
	booktitle     = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2005.27",
	isbn          = "0-7695-2288-2",
	pages         = "1136--1141",
	publisher     = "{IEEE Computer Society}",
	title         = "{A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application}",
	year          = 2005,
}

Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Raychowdhury, Kaushik RoyA Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test ApplicationDATE, 2005.

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Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Raychowdhury, Kaushik Roy
A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application
DATE, 2005.