@inproceedings{DATE-2005-CarterOS,
	author        = "Jonathan R. Carter and Sule Ozev and Daniel J. Sorin",
	booktitle     = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2005.94",
	isbn          = "0-7695-2288-2",
	pages         = "300--305",
	publisher     = "{IEEE Computer Society}",
	title         = "{Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown}",
	year          = 2005,
}