Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits
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Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy
Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits
DATE, 2006.

DATE 2006
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@inproceedings{DATE-2006-PaulKKAR,
	author        = "Bipul Chandra Paul and Kunhyuk Kang and Haldun Kufluoglu and Muhammad Ashraful Alam and Kaushik Roy",
	booktitle     = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/1131703",
	pages         = "780--785",
	publisher     = "{European Design and Automation Association, Leuven, Belgium}",
	title         = "{Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits}",
	year          = 2006,
}

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