Travelled to:1 × USA
2 × Germany
Collaborated with:K.Roy K.Kim B.C.Paul M.A.Alam J.Li A.Bansal A.E.Islam H.Kufluoglu
Talks about:circuit (3) use (3) reliabl (2) perform (2) design (2) degrad (2) under (2) power (2) estim (2) nbti (2)
Person: Kunhyuk Kang
DBLP: Kang:Kunhyuk
Contributed to:
2007
20062005Wrote 5 papers:
- DAC-2007-KangKIAR #estimation #metric #online #reliability #using
- Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement (KK, KK, AEI, MAA, KR), pp. 358–363.
- DAC-2007-KangKR #design #power management #using
- Variation Resilient Low-Power Circuit Design Methodology using On-Chip Phase Locked Loop (KK, KK, KR), pp. 934–939.
- DAC-2007-LiKBR #flexibility #performance #power management
- High Performance and Low Power Electronics on Flexible Substrate (JL, KK, AB, KR), pp. 274–275.
- DATE-2006-PaulKKAR #design #estimation #performance #reliability
- Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits (BCP, KK, HK, MAA, KR), pp. 780–785.
- DATE-2005-KangPR #analysis #statistics #using
- Statistical Timing Analysis using Levelized Covariance Propagation (KK, BCP, KR), pp. 764–769.